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Imaging X-Ray Photoelectron Spectrometer, Kratos AXIS Nova

Imaging X-Ray Photoelectron Spectrometer, Kratos AXIS Nova

Catalog Number:
GLE1503428SHI
Mfr. No.:
SHI-Kratos AXIS Nova
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      • Overview

        • X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), is a mature and widely used surface analysis technique for materials characterisation. XPS provides quantitative elemental and chemical state information from the upper most 10 nm of material. The The AXIS Nova photoelectron spectrometer can collect X-ray photoelectron spectra and images from any material that is stable under the ultra-high vacuum conditions required for the technique.

          State-of-the-art performance
          Designed for ease of use, the AXIS Nova has automated sample loading, orthogonal cameras for easy sample positioning and intuitive data acquisition software. A unique design of the AXIS Nova is the 110mm diameter sample platen allowing unrivalled large sample handling and high sample throughput. None of these attributes compromise the market-leading performance. The AXIS Nova is capable of high sensitivity, excellent energy resolution and fast, high spatial resolution imaging. It is ready to meet the analysis needs of the most challenging applications.

          Please contact us at for specific academic pricing.

      • Properties
        • Other Properties
          X-ray photoelectron spectroscopy(XPS)

          Spectroscopic performance is defined as counts per second for a FWHM measured for the Ag 3d5/2component.
          The AXIS Nova has exceptional large area(700 x 300 um)spectroscopy performance.
          Selected area modes(diameter)110 um,55 um,27 um and 15um.

          XPS parallel imaging

          Ultimate spatial resolution of parallel imaging mode is<3 um.
          Imaging fields of view are ca.950 x 950 um,425 x 425 um and 220 x 220 um.

          Performance on insulators

          The AXIS Nova has an electron only charge neutralisation system.Performance of the charge neutraliser system is confirmed on the standard polymer,polyethylene terephthalate(PET).

          Sample handling

          Up to three large,110 mm diameter sample platens can be introduced to the AXIS Nova at a time.Sample handling is fully automated.

          Ion source

          Minibeam 4 monatomic Ar+ion sourceorMinibeam 6 multi-mode Gas Cluster Ion Source(GCIS)for sample cleaning and sputter depth profiling.

          Others
          • Sensitivity
          • Resolution
          • Simplicity
          • Parallel XPS imaging
          • Automation
          • Additional Capabilities

          * For research use only.

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