Other Properties
EDX-7000/8000/8100
Measurement principle: X-ray fluorescence spectrometry
Measurement method: Energy dispersion
Target samples: Solids, liquids, powders
Measuring range: 11Na to 92U (EDX-7000) 6C to 92U (EDX-8000/8100)
Sample size: W 300 x D 275 x approx.H 100 mm (excluding radiuses)
Maximum sample mass: 5kg (200g per sample when using turret, Gross mass 2.4kg)
X-ray generator
X-ray tube: Rh target
Voltage: 4 kV to 50 kV
Current: 1 μA to 1000 μA
Cooling method: Air-cooled (with fan)
Irradiated area: Automatic switching in four stages: 1, 3, 5, and 10 mm diameter
Automatic switching in four stages: 0.3, 1, 3, and 10 mm diameter*1
Primary filters: Five types (six, including the open position), automatic replacement
Detector
Type: Silicon drift detector (SDD)
Liquid nitrogen: Not required (electronic cooling)
Sample chamber
Measurement atmosphere: Air, vacuum*1, helium (He)*2
Sample replacement*: 12-sample turret
Sample observations: Semiconductor camera
Data processor
Memory: 2 GB min. (32-bit), 4 GB min. (64-bit)
HDD: 250 GB min.
OS: WindowsTM 10 (32-bit/64-bit)*
Software: Simple analysis software (PCEDX-Navi)
General analysis software (PCEDX-Pro)
Software
Qualitative analysis: Measurement/analysis software
Quantitative analysis: Calibration curve method, correction for coexistent elements, FP method,film FP method, background FP method
Matching software: Intensity/content
Utilities: Automatic calibration functions (energy calibration, FWHM calibration)
Others: Instrument status monitoring function,
analysis results tabulation function
Installation
Temperature: 10°C to 30°C (temperature fluctuation rate 2°C/hour max.,
temperature fluctuation range: 10°C max.)
Relative humidity: 40 % to 70 % (no condensation)
Power supply: 100-240 V AC ±10 %, 2 A earthed socket
Dimensions: W 460 x D 590 x H 360 mm
Weight: Approx. 45 kg
Options: Vacuum measurement unit, helium purge unit, turret unit, screening analysis kits