SPM-9700HT, Scanning Probe Microscope

Cat. No.	Specification	Unit	Price	Quantity
LM01503394-01	Resolution: X, Y: 0.2 nm, Z: 0.01 nm	EA	Inquiry

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Product Description

Product Description

Making the Unknown Visible Scanning probe microscope (SPM) is a generic term for microscopes that scan sample surfaces with an extremely sharp probe to observe their three-dimensional image or local properties at high magnifications. The SPM-9700HT takes high-throughput observations to the next level.

Features

• High-Throughput Scanner Shortens Observation Times
• High Stability & High Throughput
• Cantilever Mounting Jig
• Wide Variety of 3D Rendering Functions Using Mouse Operations
• Nano 3D Mapping
• Ease of Operation Minimizes Distraction from Observation to Analysis
• Functionality and Expandability to Meet a Wide Range of Requirements

Specifications

Observation modes: Standard: Contact, Dynamic, Phase, Lateral Force (LFM), Force Modulation Optional: Magnetic Force (MFM), Current, Surface Potential (KFM)
Resolution: X, Y: 0.2 nm, Z: 0.01 nm
AFM head: Displacement detection system: Light source, optical lever, detector Light source: Laser diode (ON/OFF) Irradiates cantilever continuously, even while replacing samples. Detector: Photodetector

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