SPM-Nanoa, Scanning Probe Microscope/Atomic Force Microscope

Cat. No. Specification Unit Price Quantity
LM01503395-01 Max. sample size: ø50 mm x 8 mm EA Inquiry

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Product Description
Product Description
SPM-Nanoa microscopes include an advanced high-sensitivity detection system and automatic viewing functionality as standard features.
Features
• Automatic Observation
• Extensive Functionality
• Saves Time
Specifications
Installation Specifications
[Installation Environment] Temperature: 23°C ± 5°C
[Installation Environment] Relative Humidity: 60 % max. (with no condensation)
[Power Supply] Single Phase: 100 to 240 V AC, 50/60 Hz, 15 A, one circuit
[Power Supply] Ground: Type-D ground (Grounding Resistance: 100 max.)
[Size and Weight of Units] Microscope Unit: W220 x D370 x H520mm, 24kg
[Size and Weight of Units] Control Unit: W190 x D400 x H440mm, 14kg

Wide Assortment of Expansion Functionality
• Scanner:
Max. scanning size (X,Y,Z)
10 μm x 10 μm x 1 μm (standard)
30 μm x 30 μm x 5 μm (optional)
125 μm x 125 μm x 7 μm (optional)
55 μm x 55 μm x 13 μm (optional)
2.5 μm x 2.5 μm x 0.3 μm (optional)
• Sample Stage:
Max. sample size
ø50 mm x 8 mm
For 50 mm diameter samples, only the central area can be observed
Max. stroke
±5 mm
When a 40 mm diameter or smaller sample is placed in the center of the scanner
• Optical Microscope Observation:
Total magnification rate
About 220 to 1300 times
(when maximum displayed on 21.5-inch monitor)
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